Methods to directly measure the trapping potential in optical tweezers

TitleMethods to directly measure the trapping potential in optical tweezers
Publication TypeConference Papers
Year of Publication2008
AuthorsBalijepalli A, LeBrun TW, Gorman JJ, Gupta SK
Date Published2008///
Abstract

Techniques to measure the trapping force in an optical tweezers without any prior assumptions about the trapshape have been developed. The response of a trapped micro or nanoparticle to a step input is measured and
then used to calculate the trapping force experienced by the particle as a function of it’s position in the trap. This
method will provide new insight into the trapping behavior of nanoparticles, which are more weakly bound than
microparticles and thereby explore larger regions of the trapping potential due to Brownian motion. Langevin
dynamics simulations are presented to model the system and are used to demonstrate this technique. Preliminary
experimental results are then presented to validate the simulations. Finally, the measured trapping forces, from
simulations and laboratory experiments, are integrated to recover the trapping potential.

URLhttp://144.206.159.178/FT/CONF/16419087/16419102.pdf