@article {15374,
	title = {A parallel-in-time method for the transient simulation of SOI devices with drain current overshoots},
	journal = {Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on},
	volume = {13},
	year = {1994},
	month = {1994/08//},
	pages = {1035 - 1044},
	abstract = {This paper presents a new parallel-in-time algorithm for the two dimensional transient simulation of SOI devices. With this approach, simulation in both space and time domains is performed in parallel As a result, the CPU time is reduced significantly from the conventional serial-in-time method. This new approach fully exploits the inherent parallelism of the finite difference formulation of the basic semiconductor device equations and the massively parallel architecture of SIMD computers. The space domain computations are inherently parallel due to the nature of our technique of solving the finite-difference equations. Time domain parallelism is achieved by shifting the potentials from previous time points to subsequent points one-step forward along the time axis with each Gummel iteration. This algorithm employs a fixed-point iteration technique, therefore a direct solution of matrix equations is avoided. The algorithm is especially suitable for the transient simulation of SOI devices that exhibit transient drain current overshoot. Numerical experiments show that the new parallel-in-time method is up to eight times faster than the conventional serial-in-time method in SOI transient simulations. The program is coded in CM Fortran for the Connection Machine},
	keywords = {2D, algorithms;semiconductor, analysis;transient, architecture;parallel-in-time, boundaries;silicon;time-domain, computations;time, computers;SOI, computing;finite, current, device, devices;drain, devices;parallel, difference, dimensional, domain, effect, engineering, equations;fixed-point, equations;space, field, Fortran;CPU, gate, iteration, iteration;SIMD, Machine;Gummel, method;semiconductor, methods;insulated, methods;metal-insulator-semiconductor, models;semiconductor-insulator, overshoots;finite-difference, Parallel, parallelism;transient, response;, simulation;CM, simulation;digital, simulation;electronic, simulation;two, technique;massively, time;Connection, transistors;iterative},
	isbn = {0278-0070},
	doi = {10.1109/43.298039},
	author = {Tai,G.-C. and Korman,C.E. and Mayergoyz, Issak D}
}
